This high-performance shortwave infrared (SWIR) line scan camera offers exceptional imaging capabilities for machine vision applications requiring non-visible material analysis in high-speed inspection. It utilizes advanced Indium/Gallium /Arsenide (InGaAs) sensor technology and offers a wide spectral range of 950 nm to 1.700 nm for imaging beyond the visible range.
The state-of-the-art InGaAs sensor provides high sensitivity and low noise. allPIXA SWIR is available as a 1k resolution camera with 12.5 µm pixels, or a 512 resolution camera with larger 25 µm pixels. The camera delivers best results at high speeds thanks to the high sensitivity of the sensor.
The camera series offers a GigE Vision interface, which corresponds to the industry standard in image processing.
Both allPIXA SWIR models provide line rates up to 40 kHz.
Free Chromasens software tools and SDK are available. The GenICam compliant GigE Vision interface allows an easy integration into existing machine vision systems.
The SWIR range provides useful information that is not visible in the RGB wavelength spectrum and adds valuable information beyond RGB images. This is helpful for exceptional inspection tasks to detect defects and faults that cannot be seen with the human eye, for example quality inspection of semiconductors, content inspection of opaque containers, substance and moisture detection or inspection and control of coatings and surfaces.
| Description | Part Number |
|---|---|
| allPIXA SWIR 512 GigE C-Mount | CP000700-IR-512-GE-001 |
| allPIXA SWIR 1K GigE C-Mount | CP000700-IR-01K-GE-001 |
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